Data/hora: 10/06/2024 03:42:18

Provedor de dados: 	87	
País: 	Brazil	
Título: 	Non-Destructive Model to Predict Commelina diffusa Leaf Area	
Autores: 	CARVALHO,L.B.; ALVES,E.A.; BIANCO,S.	
Data: 	2017-01-01	
Ano: 	2017	
Palavras-chave: 	Plant growth; Biometry; Non-destructive method; Mathematical model; Climbing dayflower.	
Resumo: 	ABSTRACT: Leaf length (L), leaf width (W), and leaf area (LA) were measured from 100 leaves aiming to determine a simple linear equation (Y=a*X) to predict the leaf area of Commelina diffusa, an important weed infesting annual and perennial crops in Brazil and worldwide. Results indicate the equation LA=0.7*LW reliably estimates the leaf area of C. diffusa, after correlating LA with LW, and then validating that equation by analyzing four new 25-leaf samples.	
Tipo: 	Info:eu-repo/semantics/article	
Idioma: 	Inglês	
Identificador: 	http://www.scielo.br/scielo.php?script=sci_arttext&pid=S0100-83582017000100286	
Editor: 	Sociedade Brasileira da Ciência das Plantas Daninhas	
Relação: 	10.1590/s0100-83582017350100088	
Formato: 	text/html	
Fonte: 	Planta Daninha  v.35 2017	
Fonte: 	info:eu-repo/semantics/openAccess