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Provedor de dados:  5
País:  France
Título:  X-Ray Spectrometric Analysis of Trace Elements in Rocks.Correction for Instrumental Interferences
Autores:  Bougault, Henri
Cambon, Pierre
Toulhoat, H.
Data:  1977
Ano:  1977
Palavras-chave:  Histoire Ifremer
Resumo:  Investigating trace element determination in rocks and taking into account possible instrumental interferences,it is shown that the general relationship between I (net peak intensity) and c (fluorescent element concentration) is (I - Io)M = Ac + B where M is the matrix effect correction factor and A is a constant proportional to the efficiency of excitation; B and Io correspond to the intensities due to, respectively , the scattering (especially, by the sample) of any instrumental interfering radiation, and a possible stray emisision by the instrument itself.Using this equation under optimized conditions allows interferences as high as 200 ppm (if expressed in equivalent concentration) to be compensated without any significant decrease regarding the general accuracy of determinations. [NOT CONTROLLED OCR]
Tipo:  Text
Idioma:  Inglês
Editor:  Heyden & Son Ltd
Formato:  application/pdf
Fonte:  Journal title unknown (Heyden & Son Ltd), 1977 , P. 181-187
Direitos:  Heyden & Son Ltd

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