Data/hora: 02/06/2024 17:31:10

Provedor de dados: | 113
País: | Chile
Título: | Use of Near Infrared Reflectance Spectroscopy to Evaluate Quality Characteristics in Whole-Wheat Grain
Autores: | Cozzolino,Daniel; Delucchi,Inés; Kholi,Moham; Vázquez,Daniel.
Data: | 2006-12-01
Ano: | 2006
Palavras-chave: | Whole wheat; NIR; Protein; Wet gluten; Grain quality; SDS.
Resumo: | The aim of this work was to explore the potential of visible (Vis) and near infrared reflectance (NIR) spectroscopy to measure quality characteristics in whole grain wheat (Triticum aestivum L.) as a tool in breeding programs. A total of 100 samples were analyzed by the reference methods for crude protein (CP), wet gluten (WG) and sodium dodecyl sulfate (SDS) sedimentation test. Whole grain samples were scanned in a NIR monochromator instrument (400-2500 nm) in reflectance. Partial least squares (PLS) were used to develop calibration equations for the quality characteristics in whole wheat. Calibration models were validated using an independent set of samples (n = 50) randomly selected from the population set. The uncertainty of the PLS models was evaluated by the standard error of prediction (SEP). The SEP obtained were 0.35% for CP, 2.04 for SDS and 4.14% for WG. It was concluded that NIR spectroscopy might be used as a screening tool to segregate early generations of wheat genotypes. At a later stage is needed to improve the accuracy of the NIR calibrations, broadening the calibration spectra with the incorporation of more genotypes and different crop years.
Tipo: | Journal article
Idioma: | Inglês
Identificador: | http://www.scielo.cl/scielo.php?script=sci_arttext&pid=S0365-28072006000400005
Editor: | Instituto de Investigaciones Agropecuarias, INIA
Formato: | text/html
Fonte: | Agricultura Técnica  v.66 n.4 2006