Data/hora: 12/06/2024 06:36:58

Provedor de dados: 	21	
País: 	Germany	
Título: 	High-resolution analysis of a QTL for resistance to Stagonospora nodorum glume blotch in wheat reveals presence of two distinct resistance loci in the target interval	
Autores: 	Shatalina, Margarita; Messmer, Monika; Feuillet, Catherine; Mascher, Fabio; Paux, Etienne; Choulet, Frédéric; Wicker, Thomas; Keller, Beat.	
Data: 	2013-12	
Ano: 	2013	
Palavras-chave: 	Cereals; Pulses and oilseeds Breeding; Genetics and propagation Crop health; Quality; Protection.	
Resumo: 	Stagonospora nodorum glume blotch (SNG), caused by the necrotrophic fungus Stagonospora nodorum, is one of the economically important diseases of bread wheat (Triticum aestivum L.). Resistance to SNG is known to be quantitative and previous studies of a recombinant inbred line (RIL) population identified a major quantitative trait locus (QTL) for resistance to SNG on the short arm of chromosome 3B. To localize this QTL (QSng.sfr-3BS) with high resolution, we constructed a genetic map for the QTL target region using information from sequenced flow-sorted chromosomes 3B of the two parental cultivars ‘Arina’ and ‘Forno’, the physical map of chromosome 3B of cultivar ‘Chinese Spring’ and BAC-clone sequences. The mapping population of near-isogenic lines (NIL) was evaluated for SNG resistance in field infection tests. NILs segregated for disease resistance as well as for plant height; additionally, we observed a high environmental influence on the trait. Our analysis detected a strong negative correlation of SNG resistance and plant height. Further analysis of the target region identified two linked loci associated with SNG resistance. One of them was also associated with plant height, revealing an effect of QSng.sfr-3BS on plant height that was hidden in the RIL population. This result demonstrates an unexpectedly high genetic complexity of resistance controlled by QSng.sfr-3BS and shows the importance of the study of QTL in mendelized form in NILs.	
Tipo: 	Journal paper	
Identificador: 	http://orgprints.org/25038/1/Shatalina-etal-2013-TheorApplGenet-online-04dec13.pdf

Shatalina, Margarita; Messmer, Monika; Feuillet, Catherine; Mascher, Fabio; Paux, Etienne; Choulet, Frédéric; Wicker, Thomas and Keller, Beat   (2013) High-resolution analysis of a QTL for resistance to Stagonospora nodorum glume blotch in wheat reveals presence of two distinct resistance loci in the target interval.   Theoretical and Applied Genetics (Article published online: 04 december 2013), 127 (3), pp. 573-586.	
Relação: 	http://orgprints.org/25038/	
Formato: 	application/pdf