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Provedor de dados:  ArchiMer
País:  France
Título:  The emissivity of foam-covered water surface at L-band: Theoretical modeling and experimental results from the frog 2003 field experiment
Autores:  Camps, A
Vall-ilossera, M
Villarino, R
Reul, Nicolas
Chapron, Bertrand
Corbella, I
Duffo, N
Torres, F
Miranda, Jj
Sabia, R
Monerris, A
Rodriguez, R
Data:  2005-05
Ano:  2005
Palavras-chave:  Brightness temperature
Emission
Foam
Microwave radiometry
Salinity
Sea
Resumo:  Sea surface salinity can be measured by microwave radiometry at L-band (1400-1427 MHz). This frequency is a compromise between sensitivity to the salinity, small atmospheric perturbation, and reasonable pixel resolution. The description of the ocean emission depends on two main factors: 1) the sea water permittivity, which is a function of salinity, temperature, and frequency, and 2) the sea surface state, which depends on the wind-induced wave spectrum, swell, and rain-induced roughness spectrum, and by the foam coverage and its emissivity. This study presents a simplified two-layer emission model for foam-covered water and the results of a controlled experiment to measure the foam emissivity as a function of salinity, foam thickness, incidence angle, and polarization. Experimental results are presented, and then compared to the two-layer foam emission model with the measured foam parameters used as input model parameters. At 37 psu salt water the foam-induced emissivity increase is -0.007 per millimeter of foam thickness (extrapolated to nadir), increasing with increasing incidence angles at vertical polarization, and decreasing with increasing incidence angles at horizontal polarization.
Tipo:  Text
Idioma:  Inglês
Identificador:  http://archimer.ifremer.fr/doc/00000/10940/9268.pdf

DOI:10.1109/TGRS.2004.839651
Editor:  Ieee-inst Electrical Electronics Engineers Inc
Relação:  http://archimer.ifremer.fr/doc/00000/10940/
Formato:  application/pdf
Fonte:  Ieee Transactions On Geoscience And Remote Sensing (0196-2892) (Ieee-inst Electrical Electronics Engineers Inc), 2005-05 , Vol. 43 , N. 5 , P. 925-937
Direitos:  2005 IEEE
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