Registro completo |
Provedor de dados: |
ArchiMer
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País: |
France
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Título: |
The emissivity of foam-covered water surface at L-band: Theoretical modeling and experimental results from the frog 2003 field experiment
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Autores: |
Camps, A
Vall-ilossera, M
Villarino, R
Reul, Nicolas
Chapron, Bertrand
Corbella, I
Duffo, N
Torres, F
Miranda, Jj
Sabia, R
Monerris, A
Rodriguez, R
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Data: |
2005-05
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Ano: |
2005
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Palavras-chave: |
Brightness temperature
Emission
Foam
Microwave radiometry
Salinity
Sea
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Resumo: |
Sea surface salinity can be measured by microwave radiometry at L-band (1400-1427 MHz). This frequency is a compromise between sensitivity to the salinity, small atmospheric perturbation, and reasonable pixel resolution. The description of the ocean emission depends on two main factors: 1) the sea water permittivity, which is a function of salinity, temperature, and frequency, and 2) the sea surface state, which depends on the wind-induced wave spectrum, swell, and rain-induced roughness spectrum, and by the foam coverage and its emissivity. This study presents a simplified two-layer emission model for foam-covered water and the results of a controlled experiment to measure the foam emissivity as a function of salinity, foam thickness, incidence angle, and polarization. Experimental results are presented, and then compared to the two-layer foam emission model with the measured foam parameters used as input model parameters. At 37 psu salt water the foam-induced emissivity increase is -0.007 per millimeter of foam thickness (extrapolated to nadir), increasing with increasing incidence angles at vertical polarization, and decreasing with increasing incidence angles at horizontal polarization.
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Tipo: |
Text
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Idioma: |
Inglês
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Identificador: |
http://archimer.ifremer.fr/doc/00000/10940/9268.pdf
DOI:10.1109/TGRS.2004.839651
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Editor: |
Ieee-inst Electrical Electronics Engineers Inc
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Relação: |
http://archimer.ifremer.fr/doc/00000/10940/
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Formato: |
application/pdf
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Fonte: |
Ieee Transactions On Geoscience And Remote Sensing (0196-2892) (Ieee-inst Electrical Electronics Engineers Inc), 2005-05 , Vol. 43 , N. 5 , P. 925-937
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Direitos: |
2005 IEEE
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