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Provedor de dados:  ArchiMer
País:  France
Título:  Long-Term In Situ Survey of Reactive Iron Concentrations at the EMSO-Azores Observatory
Autores:  Laes-huon, Agathe
Cathalot, Cecile
Legrand, Julien
Tanguy, Virginie
Sarradin, Pierre-marie
Data:  2016-10
Ano:  2016
Palavras-chave:  Deep-sea observatory
Hydrothermal vent
In situ chemical analyzer
Monitoring the Mid-Atlantic Ridge (MoMAR)
Resumo:  A study of the temporal dynamics of iron concentrations and temperature on a faunal assemblage at the Lucky Strike vent was performed using the Tempo ecological module at the EMSO-Azores deep-sea observatory. The CHEMINI in situ analyzer was implemented on this structure to determine reactive iron concentrations in unfiltered seawater samples along with a temperature probe. Stability tests were performed on the CHEMINI analyzer before deployment (optical module, hyperbaric tests, and deep-sea calibration) for long-term in situ analysis of reactive iron (six months, 2013–2014) at the Tour Eiffel active edifice. Recorded daily, the in situ standard (25 \mu mol.L {}^{-1} ) showed excellent reproducibility (1.07%, n=522 ), confirming satisfactory analytical performance of the CHEMINI analyzer and thus validating the iron concentrations measured by the instrument. Furthermore, the analyzer proved to be reliable and robust over time. The averaged reactive iron concentration for the six-month period remained low ([Fe] =text{7.12}\pm text{2.11} \mu mol.L {}^{-1} , n=519 ), but showed some noticeable variations with temperature. Reactive iron concentrations and temperature were significantly correlated emphasizing reactive iron stabilization over the time of deployment. Period spectra indicated strong tidal influence and relevant frequencies of four to five days for both variables.
Tipo:  Text
Idioma:  Inglês

Editor:  Ieee-inst Electrical Electronics Engineers Inc
Formato:  application/pdf
Fonte:  Ieee Journal Of Oceanic Engineering (0364-9059) (Ieee-inst Electrical Electronics Engineers Inc), 2016-10 , Vol. 41 , N. 4 , P. 744-752
Direitos:  2016 IEEE - All rights reserved


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