| Hyperspectral crop reflectance data are useful for several remote sensing applications in agriculture, but there is still a need for studies to define optimal wavebands to estimate crop biophysical parameters. The objective of this work is to analyze the use of narrow and broad band vegetation indices (VI) derived from hyperspectral field reflectance measurements to estimate wheat (Triticum aestivum L.) grain yield and plant height. A field study was conducted during the winter growing season of 2003 in Campinas, São Paulo State, Brazil. Field canopy reflectance measurements were acquired at six wheat growth stages over 80 plots with four wheat cultivars (IAC-362, IAC-364, IAC-370, and IAC-373), five levels of nitrogen fertilizer (0, 30, 60, 90, and 120 kg... |
