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| Biermacher, Jon T.; Epplin, Francis M.; Brorsen, B. Wade; Solie, John B.; Raun, Bill. |
| Sensor-based precision fertilizer technologies are being developed and researched by production scientists. One such technology uses normalized difference vegetation index (NDVI) reflectance measurements of growing winter wheat plants and a nitrogen fertilizer optimization algorithm (NFOA) to determine nitrogen requirement necessary for plants to reach their yield plateau. A number of precision fertilizer application systems that use this technology are considered in this paper. A linear response stochastic plateau wheat yield function conditional on NDVI reflectance measurements is estimated and used within an expected profit-maximization framework to estimate upper bounds on the returns from the precision nitrogen application systems. The on-the-go... |
| Tipo: Conference Paper or Presentation |
Palavras-chave: Research and Development/Tech Change/Emerging Technologies. |
| Ano: 2006 |
URL: http://purl.umn.edu/21046 |
