| Here we describe a chemical analysis technique for Ca, Fe, K, Sr, Ti, and S using a recently developed Micro-XRF analyzer (Micro-XRF) with a 100-mm resolution and an XRF whole-core scanner (XRF-S) with a 5-mm resolution for selected sediment sections from a continental margin sediment core. The Micro-XRF produces highly resolved element maps of individual sections, and the calculation of individual continuous element profiles is based on overlap measurements of successive sections. By means of discrete subsamples analyzed by ICP-OES, the two XRF data sets are successfully calibrated to provide quantitative profiles of Ca, Fe, K, Sr, and Ti. We discuss the advantages and limitations of both XRF techniques. A comparison of the two independent XRF data sets... |
