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Development of an algorithm for tip-related artifacts identification in AFM biological film imaging BABT
Bernardes-Filho,Rubens; Assis,Odilio Benedito Garrido de.
One major drawback identified in atomic force microscopy imaging is the dependence of the image's precision on the shape of the probe tip. In this paper a simple algorithm is proposed to provide artifact identification signaling in-situ tip features in atomic force microscopy images. The base of the identifications lied when the angle formed between two scanned points was kept the same as the tip sweeps a certain length of the sample. The potential of the described method was illustrated on a chitosan polysaccharide film. The images produced were compared to evaluate tip-artifact regions. This algorithm showed promise as a tool in the measurement and characterization fields to separate true images from artificial images in probe microscopy.
Tipo: Info:eu-repo/semantics/article Palavras-chave: Probe microscopy; AFM; Images tip artifacts; Biological film.
Ano: 2005 URL: http://www.scielo.br/scielo.php?script=sci_arttext&pid=S1516-89132005000500020
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