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Cozzolino,Daniel; Delucchi,Inés; Kholi,Moham; Vázquez,Daniel. |
The aim of this work was to explore the potential of visible (Vis) and near infrared reflectance (NIR) spectroscopy to measure quality characteristics in whole grain wheat (Triticum aestivum L.) as a tool in breeding programs. A total of 100 samples were analyzed by the reference methods for crude protein (CP), wet gluten (WG) and sodium dodecyl sulfate (SDS) sedimentation test. Whole grain samples were scanned in a NIR monochromator instrument (400-2500 nm) in reflectance. Partial least squares (PLS) were used to develop calibration equations for the quality characteristics in whole wheat. Calibration models were validated using an independent set of samples (n = 50) randomly selected from the population set. The uncertainty of the PLS models was... |
Tipo: Journal article |
Palavras-chave: Whole wheat; NIR; Protein; Wet gluten; Grain quality; SDS. |
Ano: 2006 |
URL: http://www.scielo.cl/scielo.php?script=sci_arttext&pid=S0365-28072006000400005 |
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Yamanaka,Naoki; Fuentes,Francisco Horacio; Gilli,Javier Ramon; Watanabe,Satoshi; Harada,Kyuya; Ban,Tomohiro; Abdelnoor,Ricardo Vilela; Nepomuceno,Alexandre Lima; Homma,Yoshihisa. |
The objective of this work was to identify genomic regions that underlie resistance to Fusarium tucumaniae sp. nov., the causing agent of sudden death syndrome (SDS) in soybean in South America, using a population with a genetic background different from that previously reported for Fusarium virguliforme sp. nov. (F. solani f. sp. glycines), also responsible for SDS in soybean. Although major genes and quantitative trait loci (QTL) for SDS resistance have been identified, little is known about the same disease caused by Fusarium tucumaniae sp. nov., in South America. To identify genetic factors related to resistance to F. tucumaniae and DNA markers associated with them, a QTL analysis was performed using recombinant inbred lines. The map locations of the... |
Tipo: Info:eu-repo/semantics/article |
Palavras-chave: Glycine max; Disease index; Residual heterozygous line; SDS. |
Ano: 2006 |
URL: http://www.scielo.br/scielo.php?script=sci_arttext&pid=S0100-204X2006000900006 |
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