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Rennert, Thilo; Höschen, Carmen; Rogge, Derek; Steffens, Markus. |
Rationale: In contaminated soil, copper (Cu) is commonly distributed among various very small particles. To enlighten the qualitative distribution of Cu in a contaminated Technosol (a soil developed from deposited technogenic material) on the sub‐micron scale, we used nano‐scale secondary ion mass spectrometry (NanoSIMS). Methods: We studied seven areas (up to 40 μm × 40 μm) on a thin section of a soil horizon by NanoSIMS, measuring 12C−, 18O−, 32S−, 63Cu− and 56Fe16O−. We evaluated the NanoSIMS measurements with a novel digital image processing tool to enlighten the composition of measured areas and thus the distribution of Cu at the sub‐micron scale. Image processing comprised spatial and spectral smoothing, normalization, endmember extraction and... |
Tipo: Journal paper |
Palavras-chave: Soil quality; Environmental aspects. |
Ano: 2018 |
URL: http://orgprints.org/33265/1/rennert-etal-2018-RapidComMassSpetrum-Vol32-issue11-p851-861.pdf |
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Steffens, Markus; Rogge, Derek; Höschen, Carmen; Lugmeier, Johan; Mueller, Carsten W.; Kögel-Knabner, Ingrid. |
Soil aggregation is a key factor for a number of important biogeochemical processes (e.g. soil organic matter stabilization and nutrient and pollutant sorption) in soils. Although there is a large number of studies on the factors controlling such soil processes, it is still challenging to study these processes in-situ. However, it can be assumedthat the spatial arrangement of organic and mineral soil constituents in soil aggregates, and thus the aggregate structure determine the processes happening at the aggregate scale. Using nanoscale secondary ion mass spectroscopy and a novel digital image processing approach, we extensively analyzed the spatial distribution of ions characteristic for mineral and organic soil components on the micrometer-scale in an... |
Tipo: Conference paper, poster, etc. |
Palavras-chave: Soil quality. |
Ano: 2018 |
URL: http://orgprints.org/34931/1/steffens-etal-2018-EGU2018-Vol20-11614.pdf |
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