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| Beneduzzi,Humberto M.; Souza,Eduardo G.; Bazzi,Claudio L.; Schenatto,Kelyn. |
| ABSTRACT: Optimization of N management is one of the great challenges to be overcome in grain production, as it is directly related to productivity and can also cause environmental damage. Precision agriculture aims to solve this problem by applying nitrogen fertilizer at varying rates. Reflectance sensors are instruments capable of estimating N needs in various crops, including grain crops. However, it is not clear how these sensors perform under varying solar radiation and cloud cover, due to a lack of research on their temporal variability. Thus, this study examined the temporal variability of the NDVI (normalized difference vegetation index), as measured by an active reflectance sensor, in both soybean and wheat crops. The NDVI data were collected... |
| Tipo: Info:eu-repo/semantics/article |
Palavras-chave: Precision agriculture; Remote sensing; Vegetation index; NDVI. |
| Ano: 2017 |
URL: http://www.scielo.br/scielo.php?script=sci_arttext&pid=S0100-69162017000400771 |
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| Bazzi,Claudio L; Souza,Eduardo G; Khosla,Raj; Uribe-Opazo,Miguel A; Schenatto,Kelyn. |
| During the last few years, yield maps have become economically feasible for farmers due to technological advances in precision agriculture. However, evidence of yield profitability is still uncertain, and variability in yield has seldom been correlated to variability in profits. Differently from yield maps, profit maps can supply additional information about the economic return for each particular area of a field. The objective of the present work was to study how management decisions can be facilitated by transforming yield-map datasets into profit maps and the importance of the selection of interpolator type. Yield and profit maps were generated for each data set (three soybean fields and one corn field) using the inverse of the distance (ID), the... |
| Tipo: Journal article |
Palavras-chave: Precision agriculture; Profit map; Profitability map. |
| Ano: 2015 |
URL: http://www.scielo.cl/scielo.php?script=sci_arttext&pid=S0718-16202015000300007 |
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